A Low-Cost Jitter Measurement Technique for BIST Applications
نویسندگان
چکیده
In this paper, we present a BIST technique that measures the RMS value of a Gaussian distribution period jitter. In the proposed approach, the signal under test is delayed by two different delay values and the probabilities it leads the two delayed signals are measured. The RMS jitter can then be derived from the probabilities and the delay values. Behavior and circuit simulations are performed to validate the proposed technique and analyze the design tradeoffs, and preliminary measurement results on FPGA are also presented.
منابع مشابه
On-chip phase noise measurement, design study in 65 nm CMOS technology
Jitter is generally defined as a time deviation of the clock waveform from its desired position. The deviation which occurs can be on the leading or lagging side and it can be bounded (deterministic) or unbounded (random). Jitter is a critical specification in the digital system design. There are various techniques to measure the jitter. The straightforward approach is based on spectrum analyze...
متن کاملA low-cost built-in self-test for CP-PLL based on TDC
To ensure qualification of charge-pump locked-loop (CPPLL), a complete built-in self-test (BIST) scheme should provide functions of measurement of the clock jitter and detection of faults in CP-PLL. This paper proposes a low cost BIST structure providing both the faults detected and timing jitter measured. The structure based on the proposed time-to-digital converter (TDC), which has high resol...
متن کاملBIST for Jitter Measurement and Jitter Decomposition of CDR
This paper describes a Built-In-Self-Test (BIST) circuit that tests the relative timing jitter of NRZ data and recovered clock of PLL-based CDR. Using the jitter information, the bit error rate and peak to peak jitter can be estimated. This BIST circuit doesn’t need a high resolution and high accuracy delay line to achieve high accuracy measurement. It depends on calibration and curve fitting a...
متن کاملA Low-Cost Bit-Error-Rate BIST Circuit for High-Speed ADCs Based on Gray Coding
Real-time on-chip measurement of bit error rate (BER) for high-speed analog-to-digital converters (ADCs) does not only require expensive multi-port high-speed data acquisition equipment but also enormous post-processing. This paper proposes a low-cost built-in-self-test (BIST) circuit for high-speed ADC BER test. Conventionally, the calculation of BER requires a high-speed adder. The presented ...
متن کاملA Low-Cost High-Speed Pulse Response Based Built-In Self Test For Analog Integrated Circuits
This paper presents a pulse response-based builtin self test technique and implementation for the testing of analog integrated circuits in mixed-signal systems. This BIST technique employs two narrow width pulses as input stimuli, and monitors two voltage samples on pulse response waveform for fault detection through allowable tolerances. The BIST system implementation realizes a programmable d...
متن کامل